Using MeV ion backscattering/channeling and MC simulations to characterize the composition and structure of buried metal-metal interfaces

Authors:

R. J. Smith

C.V. Ramana

Bum-sik Choi

, Adli A. Saleh

N.R. Shivaparan

V. Shutthanandan

Journal Name:

Applied Surface Science

Volume:

219

Issue:

1

Pages From:

28

To:

38

Date:

Wednesday, January 1, 2003