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Carrier scattering mechanisms in GaS0.5Se0.5 layered crystals

Authors: 
Qasrawi, AF
Gasanly, NM
Journal Name: 
CRYSTAL RESEARCH AND TECHNOLOGY
Volume: 
37
Issue: 
6
Pages From: 
587
To: 
594
Date: 
Tuesday, January 1, 2002
Keywords: 
GaS0.5Se0.5 crystals; resistivity; Hall mobility; scattering mechanisms
Abstract: 
Systematic dark electrical resistivity and Hall mobility measurements have been carried out in the temperature range 150-400 K on n-type GaS0.5Se0.5 layered crystals. The analysis of temperature dependent electrical resistivity and carrier concentration reveals the extrinsic type of conduction with a donor impurity level located at 0.44 eV, donor and acceptor concentrations of 3.4x10(17) and 4.1x10(17) cm(-1), respectively, and an electron effective mass of 0.41 m(o). The Hall mobility is limited by the electron-phonon short-range interactions scattering at high temperatures combined with the ionized impurity scattering at low temperatures. The electron-phonon short-range interactions scattering mobility analysis reveals an electron-phonon coupling constant of 0.25 and conduction band deformation potential of 5.57 eV/Angstrom.