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Charateristics of deep submicron n-MOSFETs in the temperature range 4.2--300

Authors: 
I. Alawneh, E. Simoen, S. Biesemenms, K. De Meyer and C. Claeys
Conference: 
Annual Belgian Society General Scientific Meeting
Location: 
Faculaties Universität Notre-Dam de la Paix, Namur, Belgian
Date: 
Wednesday, May 20, 1998
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